Products tagged with 'sample prep accessory'

The TEM Wedge Tool is used to thin materials to electron transparency for TEM observation. The rear micrometer heads allow radial or axial (wedge) angle adjustments in the sample. Non-rotating micrometer heads are available to eliminate faceting of Delrin® feet.

The Cross-Sectioning Tool is used to cross-section small, unencapsulated samples such as IC's and other electronic devices.