Specialty Tools

Allied offers a specialized variant of its MetPrep 3x™/PH-3™ grinder/polisher for metallographic sample preparation in either a hot cell or glove box.

The primary difference between the models is that the hot-cell model is constructed of stainless steel with metallic components for motor drive for maximum resistance to deterioration.

Both systems are operated through a touch-screen fitted into a remote-control box that is wall-mountable and connected through the specialized cable with specialized push-pull connectors common to the design of these enclosures.

Use the configurator to build a system with the necessary components and to obtain pricing through a quote request.

Allied's high-volume Printed Circuit Board (PCB) micro sectioning and analysis solution makes it easy to prepare and document high-volume microsections for compliance with IPC standards.

From pin insertion and mounting to grinding/polishing to an automated measurement and archiving system, Allied provides a complete solution.

The CF-1 is a loading and unloading system for central force sample holders. The rotating base sets uniform mount protrusion to 3 mm and allows quick, easy positioning beneath the pad. Pneumatics are used to secure both the holder and sample/mount(s) when loading to establish a uniform plane, reducing initial grinding time and operator fatigue.

These central force sample holders are designed for polishing wafers using a semi-automatic grinder/polisher.

They feature an outer, spring-loaded compression ring that holds the wafer in place, but also conditions and compresses the pad for maximum flatness and minimal edge rounding. 

Wafers are held in place using water or a preferential light grease.  

The TEM Wedge Tool is used to thin materials to electron transparency for TEM observation. The rear micrometer heads allow radial or axial (wedge) angle adjustments in the sample. Non-rotating micrometer heads are available to eliminate faceting of Delrin® feet.

The Cross-Sectioning Tool is used to cross-section small, unencapsulated samples such as IC's and other electronic devices.

Available are models with either a serrated anvil or granite stand. The serrated anvil being a smaller surface area is better for small objects and the serrated surface minimizes registration error.

The granite stand model can be fitted (sold separately) with a locating bracket for use with X-Prep™ fixtures.