Products tagged with 'sims thinning'

The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation. 

Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill. 

Dual micrometers (pitch and roll) allow precise sample tilt adjustments relative to the abrasive plane. A rigid Z-indexing spindle maintains the predefined geometric orientation throughout the grinding/polishing process. Digital indicators enable quantifiable material removal, which can be monitored real-time (front), or preset (rear) for unattended operation. Variable speed rotation and oscillation maximize use of the entire grinding/polishing disc and minimize artifacts. Adjustable load control expands its capability to handle a range of small (delicate) to large samples.

The OptiPrep™ System is designed for production polishing of a wide variety of optical components including Ferrules, Connectors, Waveguides, Silicon V-groove, Optical Chips, Capillary/Glass Lenses, Fiber Bundles, Ribbon Fiber and Bare Fiber

Optical polishing applications rely on specific geometry. The OptiPrep™ features a fixed cam-lock interface reference that is parallel to the plane of the platen. Desired sample angles are obtained based on geometric orientation built into the fixture.

Z-positioning/indexing is displayed on the digital indicator with 1-micron resolution and can be pre-set for unattended operation. Variable speed rotation/limit rotation and oscillation with variable sweep maximize use of the entire abrasive surface.

Adjustable load control expands its capability to handle a range of small (delicate) to large samples.

Applications where the OptiPrep™ is used often require custom fixtures. Please contact Allied for assistance with a current fixture or to design and manufacture a fixture for a complete solution.